IEEE EMC Society Japan and Sendai Chapters 会員各位

            　　　　　    　　　  IEEE EMC Society Sendai Chapter Chair  曽根　秀昭

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IEEE EMC Society Sendai Chapter Research meeting

日　時：2015年9月25日(金) 14:30〜17:00

場　所：東北大学　サイバーサイエンスセンター　中会議室（3階）
http://www.cc.tohoku.ac.jp/map.html


【IEEE EMC Society Sendai Chapter Research meeting】

  14:30-14:55
  Effect of Clock Frequencies on EM Information Leakage from Cryptographic Devices
  Megumi Saito(1), Yu-ichi Hayashi(2), Takaaki Mizuki(1), Hideaki Sone(1)
  (1)Tohoku University, (2)Tohoku Gakuin University

  14:55-15:20
  Experimental study on relationship between electrode approaching speed and variation in the amplitude of electromagnetic radiation due to ESD　
  Kenichro Abe(1), Ken Kawamata(1), Shigeki Minegishi(1), Osamu Fujiwara(2)
  (1)Tohoku Gakuin University, (2)Nagoya Institute of Technology

  15:20-15:50
  Method for Estimating Fault Injection Time on Cryptographic Devices from EM Leakage　
  Ko Nakamura(1), Yu-ichi Hayashi(2), Naofumi Homma(1), Takaaki Mizuki(1), Takafumi Aoki(1), Hideaki Sone(1)
  (1)Tohoku University, (2)Tohoku Gakuin University

  (10分休憩)

  16:00-16:15
  A Study on Transmission Characteristics and Shielding Effectiveness of Shielded-Flexible Flat Cable for Differential-Signaling
  Yoshiki Kayano(1), Hiroshi Inoue(2)
  (1)Akita University, (2)The Open University of Japan

  16:15:16:30
  Introduction to Recent Research on EM Information Leakage
  Yu-ichi Hayashi(1)
  (1)Tohoku Gakuin University

  16:30-17:00
  Grounding Design for Low-Cost Ball Grid Array Package with High Shielding Effectiveness
  Keiju Yamada(1), Masaaki Ishida(1),Tomohiro Iguchi(2) 
  (1)Corporate Research & Development Center, (2)Corporate Manufacturing Engineering Center Toshiba Corporation, Kawasaki, Kanagawa, Japan


主催： IEEE EMC Society Sendai Chapter
共催： 東北大学EMC仙台ゼミナール